Adc background calibration timing

ABSTRACT

A background calibrating, skip and fill, analog/digital converter (ADC) generates an output data sequence having successive data elements representing magnitudes of successive samples of an analog input signal (X) acquired during successive cycles of a clock signal. The ADC normally samples the analog input signal during most clock cycles, but occasionally executes a calibration cycle in which it samples a reference signal of known magnitude, determines the error in its output data, and calibrates itself to eliminate the error. The ADC calculates a magnitude of data elements of the output sequence corresponding to samples of the input signal that were skipped during a calibration cycle by interpolating preceding and succeeding sample values. The ADC initiates a calibration cycle when a variation in magnitudes of at least two most recent samples of the input signal has remained within a first predetermined limit, provided that a predetermined minimum number of clock signal cycles have occurred since the calibration timing circuit last initiated a calibration cycle. The ADC may also refrain from initiating a calibration cycle unless a magnitude of a most recent sample of input signal is within a second predetermined limit.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation Application of U.S. patentapplication Ser. No. 10/894,927 entitled “ADC BACKGROUND CALIBRATIONTIMING” filed Jul. 19, 2004.

BACKGROUND OF THE INVENTION

1. Field of the Invention

The invention relates in general to analog/digital converters (ADCs) andin particular to a method and apparatus for timing backgroundcalibration in an ADC.

2. Description of Related Art

FIG. 1 depicts a typical prior art, self-calibrating, analog-digitalconverter (ADC) 22 for digitizing an analog input signal X to produce adigital data sequence Y= representing the voltage of signal X atsuccessive edges of a clock signal CLK. Input signal X passes through aswitch 24 to the input of an ADC 26. In response to each edge of clocksignal CLK, ADC 26 samples signal X and produces a “raw”, uncalibrated,digital output sequence Y supplied as input to a calibration circuit 28.For example, calibration circuit 28 may act as a lookup table, alteringthe value of each element of sequence Y= as necessary to compensate forerrors in the output sequence Y of ADC 26, thereby to produce acorresponding element of output sequence Y=. During a calibrationprocess, a calibration control circuit 30 supplies a reference signalVREF of various known voltages as input to ADC 26 via switch 24,monitors ADC output Y to determine its error, and supplies programmingdata to calibration circuit 28 configuring it to appropriatelycompensate for detected errors in Y. While FIG. 1 depicts an ADC 22including a calibration circuit 28 for altering the output of ADC 26,other self-calibrating ADCs use other approaches to calibration. Forexample, calibration control circuit 30 could calibrate ADC 26 byadjusting the gain and offset of an input amplifier within ADC 26,thereby eliminating the need for calibration circuit 28.

The errors in the output of ADC 26 arise due to various “non-ideal”effects associated with its internal components, including the settlingtime of its internal sample and hold amplifier, the finite gain andoffset of its internal amplifier(s), and reflections and other effectsdue to component mismatches. These sources of error typically limit thespeed and accuracy of ADC 26 and impose stringent requirements on itscomponent design that can prolong design time and increase hardwarecost. By compensating for errors in the output of ADC 26, calibrationcircuit 28 can reduce the severity of the ADC=s component designrequirements, thereby reducing design time and hardware cost.

ADC calibration techniques fall into two categories: foregroundcalibration and background calibration. ADC 22 of FIG. 1 employsforeground calibration wherein calibration control circuit 30 calibratesADC 22 only once, during a start-up period following power-on when ADC22 is not actively digitizing input signal X to produce output sequenceY=. After programming calibration circuit 28, calibration controlcircuit 30 signals switch 24 to supply input signal X to ADC 26 so thatADC 22 enters its normal mode of operation, continuously digitizinginput signal X to produce output sequence Y=. The main drawback toforeground calibration is that since the ADC is calibrated only once atstartup, the ADC can drift out of calibration over time. Operatingcharacteristics of components of ADC 26 can change over time, forexample due to temperature changes and circuit aging, and such changescan cause the error in output data sequence Y to drift. ADCs employingbackground calibration repeatedly carry out the calibration process “inthe background” while the ADC is digitizing an analog input signal toupdate ADC calibration from time-to-time to compensate for drift in ADCerror.

FIG. 2 illustrates a prior art self-calibrating ADC 31 employing a formof background calibration. Here the analog signal X being digitizedprovides an input to a high-speed, but inaccurate, ADC 32 as well as toa lower speed, but highly accurate, ADC 34. A calibration circuit 36modifies the output sequence Y of ADC 32 to compensate for errors,thereby to produce the digitizer output sequence Y=. A calibrationcontrol circuit 38 compares each element of the output sequence Y_(r) ofADC 34 to an element of output sequence Y of ADC 32 representing aconcurrently acquired sample of input signal X to determine the error insequence Y and then appropriately adjusts the programming of calibrationcircuit 36. This approach has the disadvantage of requiring a highlyaccurate ADC 34 not subject to errors that drift over time, and such anADC can be difficult and expensive to design and implement. U.S. Pat.No. 6,606,042 issued Aug. 12, 2003 to Sonkusale et al teaches this typeof background calibration method in the context of a pipelined ADC.

The article by I. Galton, “Digital Cancellation of D/A Converter Noisein Pipelined A/D converters,” IEEE Transactions on Circuits and SystemsII: Analog and Digital Signal Processing, vol. 47 no. 3, pp. 185-196,March 2000, discusses another approach to background calibration whereina known pseudo-random reference signal is added to the normal analoginput to produce a modified input to the ADC. The value of the referencesignal is then subtracted from the raw ADC output data to produce thedigital data representing the analog input signal. A calibration controlcircuit uses statistical analysis techniques to extract the ADC errorfrom the raw ADC output data so that it can determine how toappropriately adjust the raw data to compensate for the ADC error. Onedisadvantage to this approach is that adding the reference signal to theinput signal reduces the usable dynamic range of the normal input.

According to sampling theory, the information carried by an analogsignal can be fully preserved by discrete-time samples when an ADC=ssampling rate is higher than twice the highest frequency components ofthe signal. For a “Nyquist rate” ADC, the sampling rate just meets thatcriterion. When an ADC uses a sampling rate higher than needed, it hasextra resources available to do the calibration in the background. Oncein a while it can replace the normal analog input signal with areference signal of known magnitude to check the ADC=s error. The ADClater fills in the output data sequence with output data representingthe sample of the normal analog input signal that was “skipped” duringthe calibration cycle by interpolating preceding and subsequent samplevalues. This “skip and fill” type of background calibration works wellbut adds overhead by requiring a higher than normal sampling speed.

FIG. 3 depicts a self-calibrating ADC 42 employing skip and fillbackground calibration. A switch 44 normally passes analog input signalX to an ADC 46 producing output sequence Y. A delay circuit 48 delays Yby a number of clock cycles to produce an output sequence Y_(a). Aswitch 50 normally supplies sequence Y_(a) as an input sequence Y_(b) toa calibration circuit 52 programmed to adjust values of elements ofsequence Y_(b) to compensate for errors in sequence Y caused by ADC 46.A timer circuit 54 periodically sends a SKIP signal to a calibrationcontrol circuit 56 telling it to carry out a calibration procedurewherein it supplies a known reference voltage as input to ADC 46 viaswitch 44 in place of input signal X for one cycle of clock signal CLKso that calibration control circuit 56 can monitor Y and adjust theprogramming of calibration circuit 52 as necessary. During each clockcycle in which ADC 46 receives reference signal VREF, rather than inputsignal X, ADC output signal Y will reflect the magnitude of VREF ratherthan the magnitude of input signal X. Delay circuit 48 delays Y for Kcycles of clock signal CLK, so during the K^(th) clock cycle following acycle in which ADC 46 digitizes VREF, the value of the current elementof sequence Y_(a) will reflect the magnitude of reference signal VREFrather than input signal X. Calibration control circuit 56 thereforesignals switch 50 to pass the output Y_(c) of an interpolation filter58, rather than Y_(a) as input Y_(b) to calibration circuit 52.Interpolation filter 58 uses interpolation to estimate an appropriatevalue of the current element of Y_(c) as a function of values ofproceeding and succeeding elements of the Y sequence. The K cycle delayof the delay circuit 48 matches the processing latency of theinterpolation filter 58. For example, FIG. 4 shows the value of Y_(b) asa function of time in a case where calibration control circuit 56performs a calibration operation on every fourth cycle of the CLKsignal. Thus, interpolation filter 58 provides the value of Y_(c) onclock cycles 4, 8, 12, 16, and 20 although in practice, the calibrationprocess is carried out much less frequently. Since changes in error ofADC 46 normally occur relatively slowly, the average time betweencalibration cycles can usually be made quite long without significantlyaffecting the ability of the calibration process to compensate forchanges in ADC 46.

U.S. Pat. No. 6,473,012 discloses a “randomized timing” type of skip andfill background calibration. To implement that kind of skip and fillbackground calibration, timer 54 could be a random or pseudo-random timeinterval generator that asserts the SKIP signal with randomly orpseudo-randomly varying time intervals. Thus, as illustrated in FIG. 5,calibration cycles might occur, for example, at times 2, 5, 10, 14, and20. Randomized timing skip and fill background calibration avoidsoverlooking any periodic error pattern in Y that could be missed using afixed timing skip and fill background calibration technique.

In either type of skip and fill background calibration, interpolationfilter 58 estimates the values of skipped samples of input signal Xbased on values interpolated from neighboring samples. The interpolatedvalues will have some error, but if a highly accurate, finite impulseresponse (FIR) filter with many taps implements interpolation filter 58,the interpolation errors can be very small. However, a high performanceinterpolation filter 58 not only requires substantial hardware but alsointroduces long latency because it has to buffer sample data over a longperiod before and after a skipped sample to accurately interpolate theskipped value.

What is needed is an ADC using skip and fill background calibration thatcan achieve relatively high interpolation accuracy using aninterpolation filter having a relatively small number of taps and havinga relatively short latency.

SUMMARY OF THE INVENTION

A background calibrating, skip and fill, analog/digital converter (ADC)generates an output data sequence having successive data elementsrepresenting magnitudes of successive samples of an analog input signal(X) acquired during successive cycles of a clock signal. The ADCnormally samples the analog input signal during most clock cycles, butoccasionally executes a calibration cycle in which it samples areference signal of known magnitude, determines the error in its outputdata, and calibrates itself to eliminate the error. An interpolationfilter within the ADC calculates a magnitude of data elements of theoutput sequence corresponding to samples of the input signal that wereskipped during a calibration cycle by interpolating preceding andsucceeding sample values.

In accordance with one aspect of the invention, the ADC initiates acalibration cycle when a variation in magnitudes of at least two mostrecent samples of the input signal has remained within a firstpredetermined limit. This improves the accuracy of the interpolationfilter because the interpolation need only interpolate between dataelements that are relatively similar in magnitude.

In accordance with another aspect of the invention, the ADC refrainsfrom initiating a calibration cycle until a predetermined minimum numberof clock signal cycles have occurred since the calibration timingcircuit last initiated a calibration cycle.

In accordance with a further aspect of the invention, the ADC may alsorefrain from initiating a calibration cycle unless a magnitude of a mostrecent sample of the input signal is within a second predeterminedlimit.

The claims appended to this specification particularly point out anddistinctly claim the subject matter of the invention. However thoseskilled in the art will best understand both the organization and methodof operation of what the applicant(s) consider to be the best mode(s) ofpracticing the invention by reading the remaining portions of thespecification in view of the accompanying drawing(s) wherein likereference characters refer to like elements.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 depicts a prior art foreground calibrating analog/digitalconverter (ADC) in block diagram form.

FIGS. 2 and 3 depict prior art background calibrating ADCs in blockdiagram form.

FIGS. 4 and 5 are graphs plotting the value of the output data of theADC of FIG. 2 as functions of time.

FIG. 6 depicts an example background calibrating ADC in accordance withthe invention in block diagram form.

FIG. 7 is a graph plotting the value of the output data of the ADC ofFIG. 6 as a function of time.

FIGS. 8 and 9 depict alternative implementations of the calibrationtiming circuit of FIG. 6.

FIG. 10 depicts in block diagram form a pipelined ADC that can implementADC 66 of FIG. 6.

DETAILED DESCRIPTION OF THE INVENTION

The invention relates to a self-calibrating analog/digital converter(ADC) employing an improved “skip and fill” background calibration.While the specification below describes example implementations of theinvention believed to be the best modes of practicing the invention,other implementations of the invention are possible. Thus, the claimsappended to the specification, rather than the descriptions of theexample implementations of the invention described below, are intendedto define the true scope of the invention.

FIG. 6 depicts a self-calibrating ADC 62 in accordance with theinvention for generating an output data sequence Y= representingmagnitudes of successive samples of an analog input signal X acquired onsuccessive edges of a clock signal CLK. A switch 64, controlled by acontrol signal CONT1, normally passes analog input signal X as an inputsignal Z to an ADC 66 producing a digital data sequence Y representingmagnitudes of successive samples of analog signal X. A delay circuit 68delays Y by a number of clock cycles to produce an output sequenceY_(a). A switch 70 controlled by a control signal CONT2, normallysupplies sequence Y_(a) as an input sequence Y_(b) to a calibrationcircuit 72 programmed to adjust values of elements of sequence Y_(b) tocompensate for errors in sequence Y caused by ADC 66.

ADC 62 employs a “skip and fill” type of background calibration whereina calibration control circuit 75, supplying control signals CONT1 andCONT2, occasionally signals switch 64 to pass a reference signal VREF ofknown magnitude as the input signal Z to ADC 66 for one cycle of the CLKsignal. Calibration control circuit 75 compares the value of the elementof output sequence Y of ADC 66 produced in response to VREF to itsexpected value to determine the error in ADC 66, and then calculates andsupplies calibration data to calibration circuit 72 to update itsprogramming so that it compensates for the error in ADC 66 outputsequence Y.

During each clock cycle in which ADC 66 receives reference signal VREF,rather than input signal X, ADC output signal Y will reflect themagnitude of VREF rather than the magnitude of input signal X. Delaycircuit 68 delays sequence Y for K cycles of clock signal CLK, so duringthe K^(th) clock cycle following a cycle in which ADC 66 digitizes VREF,the value of the current element of sequence Y_(a) will reflect themagnitude of reference signal VREF rather than input signal X.Calibration control circuit 75 therefore signals switch 70 to pass theoutput Y_(c) of an interpolation filter 73, rather than Y_(a) as inputY_(b) to calibration circuit 72. Interpolation filter 73, suitably afinite-impulse response (FIR) filter, uses interpolation to estimate anappropriate value of the current element of Y_(c) as a function ofvalues of preceding and succeeding elements of the Y sequence. The Kcycle delay of the delay circuit 68 matches the processing latency ofthe interpolation filter 73, a function of the number of succeedingelements the filter uses in the calculation. Thus for each sample ofanalog input signal X that is skipped during a calibration cycle,interpolation filter 73 subsequently fills in the missing data elementwith an estimated value Y_(c) for that sample.

When ADC 66 samples analog signal X at a frequency more than twice thatof its highest frequency component, it is possible for interpolationfilter 73 to accurately estimate the value of a skipped sample of analogsignal X through interpolation of magnitudes of several preceding andsucceeding samples. However, the accuracy of the interpolation is anincreasing function of the number of neighboring samples of signal Xinterpolation filter 73 uses when calculating a value for a missingsample, which is in turn an increasing function of the cost andcomplexity of the interpolation filter.

The invention relates to the manner in which calibration control circuit75 determines when to skip a sample and carry out a calibration cycle.In particular, calibration control circuit carries out a calibrationcycle only at times when the analog input signal is not varying much sothat the magnitude of a skipped sample will be very similar to themagnitudes of the neighboring samples interpolation filter 73 uses wheninterpolating the skipped sample magnitude. For example, FIG. 7 shows asample being skipped and interpolated at time 5 because samples at times3 and 4 were very close together in magnitude. An FIR interpolationfilter 73 having only a relatively few taps could accurately estimatethe magnitude of the analog input signal sample at time 5 based on thesampled magnitude of only a few preceding and succeeding samples becausethe analog signal value is not changing rapidly around time 5.Similarly, samples were skipped and filled at times 12 and 1 7 becausethe analog signal X sample values were relatively stable at times 1 0and 11, and at times 1 5 and 1 6. Since interpolation filter 73 needonly interpolate between samples that are close together in magnitude,it can provide a very accurate estimate of the value of the skippedsample without having to implement an expensive and sophisticatedinterpolation scheme.

ADC 62 of FIG. 6 includes a calibration timing circuit 77 for assertinga signal CAL to tell calibration control circuit 75 when to initiateeach calibration cycle. Calibration timing circuit 77 counts the numberof CLK signal cycles since the last calibration cycle. When its countreaches a predetermined limit (for example 100), calibration timingcircuit 77 monitors the magnitude of the analog input signal X todetermine when it has been relatively stable for two CLK signal cyclesin that it has changed by less than some predetermined maximum. When itdetects a period of stability, calibration timing circuit 77 resets itsinternal CLK signal cycle count and asserts its output CAL signal totell calibration control circuit 75 to initiate another calibrationcycle. Thus, calibration timing circuit 77 initiates a calibration cyclewhenever input signal X has been relatively stable, but only after apredetermined number of CLK signal cycles have occurred since the mostrecent calibration cycle.

The skipped samples of the analog input signal must always be separatedby at least the delay of interpolation circuit 73. For example, wheninterpolation circuit 73 is implemented by a symmetrical 9-tap FIRfilter, the latency of the interpolation will be 4 CLK signal cycles. Insuch case calibration cycles should be separated by at least four CLKsignal cycles or interpolation filter 73 won=t have enough valid datasamples to perform the interpolation for the skipped samples.Calibration timing circuit 77 could provide any arbitrary lower limit onthe spacing between calibration cycles, as long as the number of CLKcycles between calibration cycles exceeds the interpolation delay. Forexample, it might provide for a minimum 100-cycle interval betweencalibration cycles even though the interpolation delay is only 4 cycles.In most applications it would not be necessary to perform a calibrationcycle very often to keep the ADC properly calibrated because the errorassociated with a typical ADC 66 normally changes only slowly over time.

Calibration timing circuit 77 could monitor the magnitude of analoginput signal X in various ways to determine times when it has beenrelatively stable. For example it could directly monitor input signal Xor, if the latency of ADC 66 is not too large, calibration timingcircuit 77 could monitor the most significant bits of its outputsequence Y. Or, as discussed below, when ADC 66 is a pipelined ADC,calibration timing circuit 77 could monitor the low-resolution output(s)of the ADC=s first stage(s).

FIG. 8 depicts an example implementation of calibration timing circuit77 of FIG. 6 that directly monitors the analog input signal X. A coarse(low resolution) ADC 74 digitizes input signal X in response to the sameclock signal CLK controlling the sample timing of the higher resolutionADC 66 of FIG. 6 to produce a digital data sequence Y_(d). A register 76delays Y_(d) by one CLK signal cycle to produce a digital data sequenceY_(e), A comparator 78 compares current elements of the Y_(d) and Y_(e)sequences and asserts its output signal MATCH when they are of the samevalue. Since ADC 74 has relatively coarse resolution, concurrentelements of the Yd and Y_(e) sequences will match even though the actualmagnitude of analog input signal X changes by a small amount betweensuccessive samples. Thus the MATCH signal indicates when the analoginput signal has been relatively stable for one clock cycle. A counter80 counts down from a predetermined number (MIN_INTERVAL) on each edgeof the CLK signal asserts an ENABLE signal when the count reaches 0.When comparator 78 thereafter asserts the MATCH signal, an AND gate 82asserts the CAL signal to initiate a calibration cycle. The CAL signalalso resets counter 80. Thus the calibration timing circuit of FIG. 8initiates a calibration cycle only when both of the following twoconditions are true:

1. A number of CLK signal cycles since the last calibration cycle is atleast as large as the number specified by MIN INTERVAL.

2. The value of Yd has remained stable, to within the resolution of ADC74, for two CLK signal cycles.

FIG. 9 illustrates a modified version of calibration timing circuit 77of FIG. 8 wherein an absolute value circuit 83, a comparator 84 and ANDgate 86 have been added. Absolute value circuit 83 finds the absolutevalue of Y_(d) and comparator 84 compares |Y_(d)| to a reference valueMAXV and asserts an enable signal EN when |Y_(d)| is less than MAXV. ANDgate 86 ands the output of AND gate 82 with enable signal EN to producethe CAL signal. This embodiment of calibration timing circuit 77 helpsto improve the accuracy of the interpolation by ensuring that inputsignal X of FIG. 6 is of low magnitude at the time a sample is skipped.When input signal X is small, the error introduced by interpolation isalso small.

Thus the calibration timing circuit of FIG. 9 initiates a calibrationcycle only when all of the following three conditions are true:

1. A number of CLK signal cycles since the last calibration cycle is atleast as large as the number specified by MIN INTERVAL.

2. The value of Yd has remained stable, to within the resolution of ADC74, for two CLK signal cycles.

3. The magnitude of Yd is currently less than the value of MAXV.

The calibration timing circuit 77 of FIG. 8 or 9 requires a coarse ADC74 to directly monitor analog signal X, but if the latency of ADC 66 ofFIG. 6 is not too large, it is possible to use the most significant bitsof the output sequence Y of ADC 66 to provide the Y_(d) input toregister 76 since those bits of sequence Y would be equivalent to theoutput of coarse ADC 74. Alternatively a quantizer could quantize theoutput of ADC 66 to supply the Y_(d) input to register 76. In eithercase ADC 74 could be eliminated.

It is also possible to eliminate coarse ADC 74 of FIGS. 8 or 9 when ADC66 is a pipelined ADC, because a pipelined ADC includes an internalcoarse ADC that could supply Y_(d). FIG. 10 illustrates an examplepipelined ADC including a set of N stages S(1)-S(N). Each Kth stage S(K)digitizes its input signal with relatively low resolution to produceoutput data y_(K) representing its input signal magnitude and alsoproduces an analog residue signal r_(K) supplied as the input signal tothe next stage. The magnitude of the output residue signal r_(K) ofstage S(K) is proportional to the difference between the magnituderepresented by y_(K) and the magnitude of stage input signal r_(K-1),where the analog input signal X acts as input to stage S(1). A set ofshift registers 90 delay each signal y_(K) by N-K clock cycles toproduce separate portions of the ADC output data sequence Y. If thepipelined ADC of FIG. 1 0 were to implement ADC 66 of FIG. 6, then theoutput y₁ of stage S(1) could provide the Y_(d) input to register 76,provided stage S(1) has appropriate resolution.

As discussed above, the invention relates primarily to how calibrationcontrol circuit 75 acquires information regarding the error in theoutput of ADC 66 from which it determines how to adjust ADC calibration.Methods by which a calibration control circuit calibrates an ADC oncethe error information is known are well known in the prior art. WhileFIG. 6 is an example of a self-calibrating ADC 62 in accordance with theinvention employing a calibration circuit 72 to adjust its outputsequence, other embodiments of the invention may employ othercalibration mechanisms. For example, rather than adjusting a calibrationcircuit 72 at the output of ADC 62, calibration control circuit 75 coulddirectly adjust internal parameters of ADC 66. For example, calibrationcontrol circuit 75 might adjust a gain and offset of an internal inputsignal amplifier within ADC 66. In such case calibration circuit 72 canbe omitted, with sequence Y_(b) directly providing output sequence Y=.

The foregoing specification and the drawings depict exemplaryembodiments of the best mode(s) of practicing the invention, andelements or steps of the depicted best mode(s) exemplify the elements orsteps of the invention as recited in the appended claims. However theappended claims are intended to apply to any mode of practicing theinvention comprising the combination of elements or steps as describedin any one of the claims, including elements or steps that arefunctional equivalents of the example elements or steps of the exemplaryembodiment(s) of the invention depicted in the specification anddrawings.

1. A analog/digital (A/D) converter, the A/D converter comprising: ananalog/digital converting modular adapted to generate an output datasequence according to an analog signal, and perform a calibrationprocedure according to a calibration signal; and a calibration controlcircuit, coupled to the analog/digital converting modular, adapted togenerate the calibration signal in response to a behavior of the analogsignal.
 2. The A/D converter of claim 1, wherein the behavior of theanalog signal comprises following condition: a variation in magnitudesof at least two most recent samples of the analog signal has remainedwithin a predetermined limit.
 3. The A/D converter of claim 1, whereinthe behavior of the analog signal comprises following conditions: avariation in magnitudes of at least two most recent samples of theanalog signal has remained within a predetermined limit, and apredetermined minimum number of clock signal cycles have occurred sincethe calibration control circuit last generated the calibration signal.4. The A/D converter of claim 1, wherein the behavior of the analogsignal comprises following conditions: a variation in magnitudes of atleast most recent samples of the analog signal has remained within afirst predetermined limit, a predetermined minimum number of clocksignal cycles have occurred since the calibration control circuit lastgenerated the calibration signal, and a magnitude of a most recentsample of the analog signal is within a second predetermined limit. 5.The A/D converter of claim 1, wherein the A/D converter is a backgroundcalibrated A/D converter and the calibration procedure is a backgroundcalibration procedure.
 6. The A/D converter of claim 5, wherein thebehavior of the analog signal comprises following condition: a variationin magnitudes of at least two most recent samples of the analog signalhas remained within a predetermined limit.
 7. The A/D converter of claim1, wherein the analog/digital converting modular comprises a pipelinedanalog/digital converter (ADC) having a plurality of stages.
 8. A methodfor calibrating an analog/digital (A/D) converter generating an outputdata according to an analog signal, the method comprising the steps of:monitoring the analog signal to generate a calibration signal when itexhibits a particular behavior, and initiating a calibration procedureaccording to the calibration signal.
 9. The method of claim 8 whereinthe particular behavior comprises following condition: a variation inmagnitudes of at least two most recent samples of the analog signal,which has remained within a predetermined limit.
 10. The method of claim8 wherein the particular behavior comprises following conditions: avariation in magnitudes of at least two most recent samples of theanalog signal has remained within a predetermined limit, and apredetermined minimum number of clock signal cycles have occurred sincethe last calibration procedure is initiated.
 11. The method of claim 8wherein the particular behavior comprises following conditions: avariation in magnitudes of at least most recent samples of the analogsignal has remained within a first predetermined limit, a predeterminedminimum number of clock signal cycles have occurred since the lastcalibration procedure is initiated, and a magnitude of a most recentsample of the analog signal is within a second predetermined limit. 12.The method of claim 8 wherein the step of monitoring the analog signalcomprises: digitizing the analog signal to produce successive elementsof a second data sequence, and comparing successive elements of thesecond data sequence to determine whether they represent similarmagnitudes.
 13. The method of claim 8, wherein the A/D converter is abackground calibrated A/D converter and the calibration procedure is abackground calibration procedure.